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ISO 17901-1:2015

Current Revision

Optics and photonics - Holography - Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms

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ISO 17901-1:2015 specifies the terms related to optical characteristics of holograms, the method to measure their diffraction efficiency, and the angular and wavelength selectivity measurement methods. These measurement methods are applicable to any type of hologram if the hologram yields a simple diffraction pattern, which means the reconstructed wave can be clearly separated from other diffracted and non-diffracted waves. In other words, holograms that yield complex diffraction patterns are excluded. There are no restrictions on the materials used to form the holograms.


SDO ISO: International Organization for Standardization
Document Number ISO 17901
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 172/SC 9
Publish Date Document Id Type View
Not Available ISO 17901-1:2015 Revision