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BSI BS IEC 62951-8:2023

Current Revision

Semiconductor devices. Flexible and stretchable semiconductor devices.Test method for stretchability, flexibility, and stability of flexible resistive memory.

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Semiconductor devices. Flexible and stretchable semiconductor devices.Test method for stretchability, flexibility, and stability of flexible resistive memory.

SDO BSI: British Standards Institution
Document Number BS IEC 62951-8
Publication Date Jan. 24, 2023
Language en - English
Page Count 18
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Jan. 24, 2023 BS IEC 62951-8:2023 Revision