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ASTM F77-69(1996)

Current Revision

Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)

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1.1 This test method covers the determination of the apparent density of ceramic parts, used in electron device and semiconductor applications, with a maximum dimension of 25 mm (1 in.) and having zero or discontinuous porosity.

1.2 The values stated in SI units are to be regarded as the standard. The values in parentheses are for information only.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability or regulatory limitations prior to use.


SDO ASTM: ASTM International
Document Number F77
Publication Date Jan. 1, 1996
Language en - English
Page Count 2
Revision Level 69(1996)
Supercedes
Committee C21.03
Publish Date Document Id Type View
Jan. 1, 1996 F0077-69R96 Revision