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ASTM F1845-97

Historical Revision

Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer (Withdrawn 2023)

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1.1 This test method determines the concentrations of trace metallic impurities in high purity (99.99 wt. % pure, or purer, with respect to metallic trace impurities) aluminum-copper, aluminum-silicon and aluminum-copper-silicon alloys with major alloy constituents as follows:

aluminum---Greater than 95.0% copper---Less or equal than 5.0% silicon---Less or equal than 5.0%

1.2 This test method pertains to analysis by magnetic-sector glow discharge mass spectrometer (GDMS).

1.3 This test method does not include all the information needed to complete GDMS analyses. Sophisticated computer-controlled laboratory equipment, skillfully used by an experienced operator, is required to achieve the required sensitivity. This test method does cover the particular factors (for example, specimen preparations, setting of relative sensitivity factors, determination of detection limits, etc.) known by the responsible technical committee to effect the reliability of high purity aluminum analyses.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


SDO ASTM: ASTM International
Document Number F1845
Publication Date Dec. 10, 1997
Language en - English
Page Count 4
Revision Level 97
Supercedes
Committee F01.17
Publish Date Document Id Type View
May 1, 2016 F1845-08R16 Revision
June 15, 2008 F1845-08 Revision
Dec. 10, 1997 F1845-97 Revision
Dec. 10, 2002 F1845-97R02 Reaffirmation