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ASTM F1263-99

Historical Reaffirmation

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

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1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary though exact knowledge may be replaced by over-conservative estimates of this distribution.


SDO ASTM: ASTM International
Document Number F1263
Publication Date Dec. 10, 1999
Language en - English
Page Count 3
Revision Level 99
Supercedes
Committee F01.11
Publish Date Document Id Type View
June 1, 2011 F1263-11 Revision
Dec. 1, 2019 F1263-11R19 Reaffirmation
Dec. 10, 1999 F1263-99R05 Reaffirmation
Dec. 10, 1999 F1263-99 Reaffirmation