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ASTM E1172-16

Historical Revision

Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer

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1.1 This practice covers the components of a wavelength dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each instrument. However, the practice does attempt to identify which tolerances are critical and thus which should be specified.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in 5.3.1.2 and 5.3.2.4, and in Section 7.


4.1 This practice describes the essential components of a wavelength dispersive X-ray spectrometer. This description is presented so that the user or potential user may gain a cursory understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each instrument.

4.2 It is understood that a laboratory may implement this practice or an X-ray fluorescence method in partnership with a manufacturer of the analytical instrumentation. If a laboratory chooses to consult with an instrument manufacturer, then the following should be considered. The laboratory should have an idea of the alloy matrices to be analyzed, elements and mass fraction ranges to be determined, and the expected performance requirements for each of these elements. The laboratory should inform the instrument manufacturer of these requirements so they may develop an analytical method which meets the laboratory’s expectations. Typically, instrument manufacturers customize the instrument configuration to satisfy the end-user’s requirements for elemental coverage, elemental precision, and detection limits. Instrument manufacturer developed analytical methods may include specific parameters for sample excitation, wavelengths, inter-element interference corrections, calibration and regression, equipment configuration/installation, and sample preparation requirements. Laboratories should have a basic understanding of the parameters derived by the manufacturer.

SDO ASTM: ASTM International
Document Number E1172
Publication Date June 1, 2016
Language en - English
Page Count 5
Revision Level 16
Supercedes
Committee E01.20
Publish Date Document Id Type View
Dec. 1, 2022 E1172-22 Revision
June 1, 2016 E1172-16 Revision
Nov. 15, 2011 E1172-87R11 Reaffirmation
June 10, 2003 E1172-87R03 Reaffirmation
Jan. 1, 2001 E1172-87R01 Reaffirmation
Jan. 1, 2001 E1172-87R96 Reaffirmation