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ASTM E1127-91(1997)

Current Reaffirmation

Standard Guide for Depth Profiling in Auger Electron Spectroscopy (Withdrawn 2024)

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1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy.

1.2 Guidelines are given for depth profiling by the following:

Section Ion Sputtering 6 Angle Lapping and Cross-Sectioning 7 Mechanical Cratering 8 Nondestructive Depth Profiling 9

1.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


SDO ASTM: ASTM International
Document Number E1127
Publication Date Sept. 10, 1997
Language en - English
Page Count 4
Revision Level 91(1997)
Supercedes
Committee E42.03
Publish Date Document Id Type View
Oct. 1, 2024 E1127-24 Revision
June 1, 2015 E1127-08R15 Revision
Oct. 1, 2008 E1127-08 Revision
May 10, 2003 E1127-03 Revision
Sept. 10, 1997 E1127-91R97 Reaffirmation