Logo

ASTM E1127-03

Historical Revision

Standard Guide for Depth Profiling in Auger Electron Spectroscopy (Withdrawn 2024)

$83.00

$83.00

$149.40


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


...

1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy.

1.2 Guidelines are given for depth profiling by the following:

Section
Ion Sputtering6
Angle Lapping and Cross-Sectioning7
Mechanical Cratering8
Nondestructive Depth Profiling9

1.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


Auger electron spectroscopy yields information concerning the chemical and physical state of a solid surface in the near surface region. Nondestructive depth profiling is limited to this near surface region. Techniques for measuring the crater depths and film thicknesses are given in (35).

Ion sputtering is primarily used for depths of less than the order of 1 μm.

Angle lapping or mechanical cratering is primarily used for depths greater than the order of 1 μm.

The choice of depth profiling methods for investigating an interface depends on surface roughness, interface roughness, and film thickness (1).3

SDO ASTM: ASTM International
Document Number E1127
Publication Date May 10, 2003
Language en - English
Page Count 5
Revision Level 03
Supercedes
Committee E42.03
Publish Date Document Id Type View
Oct. 1, 2024 E1127-24 Revision
June 1, 2015 E1127-08R15 Revision
Oct. 1, 2008 E1127-08 Revision
May 10, 2003 E1127-03 Revision
Sept. 10, 1997 E1127-91R97 Reaffirmation