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ASTM E1078-97

Historical Revision

Standard Guide for Procedures for Specimen Preparation and Mounting in Surface Analysis

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1.1 This guide covers specimen preparation and mounting prior to, during, and following surface analysis.

1.2 This guide applies to the following surface analysis disciplines:

1.2.1 Auger electron spectroscopy (AES),

1.2.2 X-ray photoelectron spectroscopy (XPS or ESCA), and

1.2.3 Secondary ion mass spectrometry, SIMS.

1.2.4 Although primarily written for AES, XPS, and SIMS, methods will also apply to many surface sensitive analysis methods such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


SDO ASTM: ASTM International
Document Number E1078
Publication Date Sept. 10, 1997
Language en - English
Page Count 9
Revision Level 97
Supercedes
Committee E42.03
Publish Date Document Id Type View
Oct. 1, 2014 E1078-14 Revision
May 1, 2009 E1078-09 Revision
Aug. 10, 2002 E1078-02 Revision
Sept. 10, 1997 E1078-97 Revision
Dec. 1, 2020 E1078-14R20 Reaffirmation